As already described for XPS and ToF-SIMS the determination of the chemical composition and surface structure is often an important aspect when dealing with changes of a surface. In some cases the surface structures and morphology play an even more eminent role in solving a problem at hand. Also, tracing changes of surface structures as well as special features or individual areas of the surface of a product can help to understand and tune surface properties. Further, classification of defects can be essential to identify potential sources for variations in surface structures. Nevertheless, it is important to not only depend on the results of one single method, but to combine different methods. Thus, for example relations between chemical composition and surface structures or between wettability and morphology can be determined.

In the following you’ll find some examples in which microscopy can be of assistance:

  • Analysis of the chemical composition and surface structures of contamination, enclosures or pores in coatings
  • Quality control and production monitoring of wafer coatings
  • Measurement of corrosion and temperature resistance for any material
  • Investigation of growth and morphology of crystals and surface features
  • Quality management and troubleshooting of fractures and erosion
  • Analysis of liquid interaction with textiles, polymer films or plastic components

Thus, we do not only count on the precision of XPS and ToF SIMS but when necessary we also apply optical microscopy and SEM in order to answer any of our customers questions.